Fast and sensitive multi-component analysis

• Selective ionization (SI) with various reactant gases
• Can be switched to electron impact ionization (EI)
• Quadrupole analyzer with ion counter (mass range 1-300/512)
• Customer-specific configuration of gas inlet (pressure and temperature-stabilized)
• Rapid switching (< 10ms) between primary ions

The GAM 600 SI has been specially developed for analyzing complex gas mixtures where other analytical methods fail. In combination with highly sensitive ion counting capability the special ionization technology offers increased selectivity and enables reliable measurements even in the lower ppb range.

The GAM 600SI has a pressure-controlled and heated gas inlet system, offering the possibility of using various reactant gases, soft ionization and conventional electron impact technology. Even the most demanding analytical challenges can now be met.

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